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ADG706/adg707 a one technology way, p.o. box 9106, norwood, ma 02062-9106, u.s.a. tel: 781/329-4700www.analog.com fax: 781/326-8703 ? analog devices, inc., 2002 cmos, +1.8 v to +5.5 v/ 2.5 v, 2.5 low-voltage, 8-/16-channel multiplexers information furnished by analog devices is believed to be accurate and reliable. however, no responsibility is assumed by analog devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. no license is granted by implication or otherwise under any patent or patent rights of analog devices. rev. a features +1.8 v to +5.5 v single supply 2.5 v dual supply 2.5 on resistance 0.5 on resistance flatness 100 pa leakage currents 40 ns switching times single 16-to-1 multiplexer ADG706 differential 8-to-1 multiplexer adg707 28-lead tssop package low-power consumption ttl/cmos-compatible inputs applications data acquisition systems communication systems relay replacement audio and video switching battery-powered systems general description the ADG706 and adg707 are low-voltage, cmos analog multiplexers comprising 16 single channels and eight differential channels, respectively. the ADG706 switches one of 16 in puts (s1?16) to a common output, d, as determined by the 4-bit b inary address lines a0, a1, a2, and a3. the adg707 switches one of eight differential inputs to a common differential output as determined by the 3-bit binary address lines a0, a1, and a2. an en input on both devices is used to enable or disable the device. when disabled, all channels are switched off. low-power consumption and operating supply range of 1.8 v to 5.5 v make the ADG706 and adg707 ideal for battery-powered, portable instruments. all channels exhibit break-before-make switching action preventing momentary shorting w hen switch- ing channels. these devices are also designed to operate from a dual supply of 2.5 v. these multiplexers are designed on an enhanced submicron process that provides low-power dissipation yet gives high switching speed, very low on resistance, and leakage currents. on resistance is in the region of a few ohms and is closely matched between switches and very flat over the full signal range. these parts can operate equally well as either multiplexers or demultiplexers and have an input signal range that extends to the supplies. the ADG706 and adg707 are available in small 28-lead tssop packages. functional block diagrams s1 s16 a0 d a3 a1 ADG706 s1a a0 da a1 s8a s1b s8b db en adg707 en a2 a2 1-of-16 decoder 1-of-8 decoder product highlights 1. single-/dual-supply operation. the ADG706 and adg707 are fully specified and guaranteed with 3 v and 5 v single-supply and 2.5 v dual-supply rails. 2. low on resistance (2.5 ? typical) 3. low-power consumption (<0.01 w) 4. guaranteed break-before-make switching action 5. small 28-lead tssop package
?2? rev. a ADG706/adg707especifications 1 (v dd = 5 v 10%, v ss = 0 v, gnd = 0 v, unless otherwise noted.) e40 c parameter 25 c to +85 c unit test conditions/comments analog switch analog signal range 0 v to v dd v on resistance (r on ) 2.5 typ v s = 0 v to v dd , i ds = 10 ma; 4.5 5 max test circuit 1 on resistance match between 0.3 typ v s = 0 v to v dd, i ds = 10 ma channels ( r on ) 0.8 max on resistance flatness (r flat(on) ) 0.5 typ v s = 0 v to v dd , i ds = 10 ma 1.2 max leakage currents v dd = 5.5 v source off leakage i s (off) 0.01 na typ v d = 4.5 v/1 v, v s = 1 v/4.5 v; 0.1 0.3 na max test circuit 2 drain off leakage i d (off) 0.01 na typ v d = 4.5 v/1 v, v s = 1 v/4.5 v; ADG706 0.4 1.5 na max test circuit 3 adg707 0.2 1na max channel on leakage i d , i s ( on) 0.01 na typ v d = v s = 1 v, or 4.5 v; ADG706 0.4 1.5 na max test circuit 4 adg707 0.2 1na max digital inputs input high voltage, v inh 2.4 v min input low voltage, v inl 0.8 v max input current i inl or i inh 0.005 a typ v in = v inl or v inh 0.1 a max c in , digital input capacitance 5 pf typ dynamic characteristics 2 t transition 40 ns typ r l = 300 , c l = 35 pf, test circuit 5; 60 ns max v s1 = 3 v/0 v, v s16 = 0 v/3 v break-before-make time delay, t d 30 ns typ r l = 300 , c l = 35 pf; 1 ns min v s = 3 v, test circuit 6 t on ( en) 32 ns typ r l = 300 , c l = 35 pf; 50 ns max v s = 3 v, test circuit 7 t off ( en) 10 ns typ r l = 300 , c l = 35 pf; 14 ns max v s = 3 v, test circuit 7 charge injection 5pc typ v s = 1 v, r s = 0 , c l = 1 nf; test circuit 8 off isolation e60 db typ r l = 50 , c l = 5 pf, f = 10 mhz; e80 db typ r l = 50 , c l = 5 pf, f = 1 mhz; test circuit 9 channel-to-channel crosstalk e60 db typ r l = 50 , c l = 5 pf, f = 10 mhz; e80 db typ r l = 50 , c l = 5 pf, f = 1 mhz; test circuit 10 e3 db bandwidth ADG706 25 mhz typ r l = 50 , c l = 5 pf, test circuit 9 adg707 36 mhz typ r l = 50 , c l = 5 pf, test circuit 9 c s (off) 13 pf typ f = 1 mhz c d (off) ADG706 180 pf typ f = 1 mhz adg707 90 pf typ f = 1 mhz c d , c s ( on) ADG706 200 pf typ f = 1 mhz adg707 100 pf typ f = 1 mhz power requirements v dd = 5.5 v i dd 0.001 a typ digital inputs = 0 v or 5.5 v 1.0 a max notes 1 temperature range is e40 c to +85 c. 2 guaranteed by design, not subject to production test. specifications subject to change without notice.
?3? rev. a ADG706/adg707 (v dd = 3 v 10%, v ss = 0 v, gnd = 0 v, unless otherwise noted.) specifications 1 e40 c parameter 25 c to +85 c unit test conditions/comments analog switch analog signal range 0 v to v dd v on resistance (r on )6 typ v s = 0 v to v dd , i ds = 10 ma; 11 12 max test circuit 1 on resistance match between 0.4 typ v s = 0 v to v dd, i ds = 10 ma channels ( r on ) 1.2 max on resistance flatness (r flat(on) )3 typ v s = 0 v to v dd , i ds = 10 ma leakage currents v dd = 3.3 v source off leakage i s (off) 0.01 na typ v s = 3 v/1 v, v d = 1 v/3 v; 0.1 0.3 na max test circuit 2 drain off leakage i d (off) 0.01 na typ v s = 3 v/1 v, v d = 1 v/3 v; ADG706 0.4 1.5 na max test circuit 3 adg707 0.2 1na max channel on leakage i d , i s ( on) 0.01 na typ v s = v d = 1 v or 3 v; ADG706 0.4 1.5 na max test circuit 4 adg707 0.2 1na max digital inputs input high voltage, v inh 2.0 v min input low voltage, v inl 0.8 v max input current i inl or i inh 0.005 a typ v in = v inl or v inh 0.1 a max c in , digital input capacitance 5 pf typ dynamic characteristics 2 t transition 45 ns typ r l = 300 , c l = 35 pf, test circuit 5 75 ns max v s1 = 2 v/0 v, v s16 = 0 v/2 v break-before-make time delay, t d 30 ns typ r l = 300 , c l = 35 pf; 1 ns min v s = 2 v, test circuit 6 t on (en) 40 ns typ r l = 300 , c l = 35 pf; 70 ns max v s = 2 v, test circuit 7 t off (en) 20 ns typ r l = 300 , c l = 35 pf; 28 ns max v s = 2 v, test circuit 7 charge injection 5pc typ v s = 1 v, r s = 0 , c l = 1 nf; test circuit 8 off isolation e60 db typ r l = 50 , c l = 5 pf, f = 10 mhz; e80 db typ r l = 50 , c l = 5 pf, f = 1 mhz; test circuit 9 channel-to-channel crosstalk e60 db typ r l = 50 , c l = 5 pf, f = 10 mhz; e80 db typ r l = 50 , c l = 5 pf, f = 1 mhz; test circuit 10 e3 db bandwidth ADG706 25 mhz typ r l = 50 , c l = 5 pf, test circuit 9 adg707 36 mhz typ r l = 50 , c l = 5 pf, test circuit 9 c s (off) 13 pf typ f = 1 mhz c d (off) ADG706 180 pf typ f = 1 mhz adg707 90 pf typ f = 1 mhz c d , c s ( on) ADG706 200 pf typ f = 1 mhz adg707 100 pf typ f = 1 mhz power requirements v dd = 3.3 v i dd 0.001 a typ digital inputs = 0 v or 3.3 v 1.0 a max notes 1 temperature range is e40 c to +85 c. 2 guaranteed by design, not subject to production test. specifications subject to change without notice.
?4? rev. a ADG706/adg707 (v dd = +2.5 v 10%, v ss = e2.5 v 10%, gnd = 0 v, unless otherwise noted.) dual supply 1 e40 c parameter 25 c to +85 c unit test conditions/comments analog switch analog signal range v ss to v dd v on resistance (r on ) 2.5 typ v s = v ss to v dd , i ds = 10 ma; 4.5 5 max test circuit 1 on resistance match between 0.3 typ v s = v ss to v dd , i ds = 10 ma channels ( r on ) 0.8 max on resistance flatness (r flat(on) ) 0.5 typ v s = v ss to v dd , i ds = 10 ma 1.2 max leakage currents v dd = +2.75 v, v ss = e2.75 v source off leakage i s (off) 0.01 na typ v s = +2.25 v/e1.25 v, v d = e1.25 v/+2.25 v; 0.1 0.3 na max test circuit 2 drain off leakage i d (off) 0.01 na typ v s = +2.25 v/e1.25 v, v d = e1.25 v/+2.25 v; ADG706 0.4 1.5 na max test circuit 3 adg707 0.2 1na max channel on leakage i d , i s ( on) 0.01 na typ v s = v d = +2.25 v/e1.25 v, test circuit 4 ADG706 0.4 1.5 na max adg707 0.2 1na max digital inputs input high voltage, v inh 1.7 v min input low voltage, v inl 0.7 v max input current i inl or i inh 0.005 a typ v in = v inl or v inh 0.1 a max c in , digital input capacitance 5 pf typ dynamic characteristics 2 t transition 40 ns typ r l = 300 , c l = 35 pf, test circuit 5 60 ns max v s1 = 1.5 v/0 v, v s16 = 0 v/1.5 v break-before-make time delay, t d 15 ns typ r l = 300 , c l = 35 pf; 1 ns min v s = 1.5 v, test circuit 6 t on ( en) 32 ns typ r l = 300 , c l = 35 pf; 50 ns max v s = 1.5 v, test circuit 7 t off ( en) 16 ns typ r l = 300 , c l = 35 pf; 26 ns max v s = 1.5 v, test circuit 7 charge injection 8pc typ v s = 0 v, r s = 0 , c l = 1 nf; test circuit 8 off isolation e60 db typ r l = 50 , c l = 5 pf, f = 10 mhz; e80 db typ r l = 50 , c l = 5 pf, f = 1 mhz; test circuit 9 channel-to-channel crosstalk e60 db typ r l = 50 , c l = 5 pf, f = 10 mhz; e80 db typ r l = 50 , c l = 5 pf, f = 1 mhz; test circuit 10 e3 db bandwidth ADG706 25 mhz typ r l = 50 , c l = 5 pf, test circuit 9 adg707 36 mhz typ r l = 50 , c l = 5 pf, test circuit 9 c s (off) 13 pf typ f = 1 mhz c d (off) ADG706 180 pf typ f = 1 mhz adg707 90 pf typ f = 1 mhz c d , c s ( on) ADG706 200 pf typ f = 1 mhz adg707 100 pf typ f = 1 mhz power requirements i dd 0.001 a typ v dd = +2.75 v 1.0 a max digital inputs = 0 v or 2.75 v i ss 0.001 a typ v ss = e2.75 v 1.0 a max digital inputs = 0 v or 2.75 v notes 1 temperature range is e40 c to +85 c. 2 guaranteed by design, not subject to production test. specifications subject to change without notice.
?5? rev. a ADG706/adg707 absolute maximum ratings 1 (t a = 25 c unless otherwise noted.) v dd to v ss . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 v v dd to gnd . . . . . . . . . . . . . . . . . . . . . . . . . . e0.3 v to +7 v v ss to gnd . . . . . . . . . . . . . . . . . . . . . . . . . . +0.3 v to e3.5 v analog inputs 2 . . . . . . . . . . . . . . v ss e 0.3 v to v dd + 0.3 v or 30 ma, whichever occurs first digital inputs 2 . . . . . . . . . . . . . . . . . e0.3 v to v dd + 0.3 v or 30 ma, whichever occurs first peak current, s or d . . . . . . . . . . . . . . . . . . . . . . . . . . 100 ma (pulsed at 1 ms, 10% duty cycle max) continuous current, s or d . . . . . . . . . . . . . . . . . . . . . 30 ma operating temperature range industrial . . . . . . . . . . . . . . . . . . . . . . . . . . e40 c to +85 c pin configurations storage temperature range . . . . . . . . . . . . e65 c to +150 c junction temperature . . . . . . . . . . . . . . . . . . . . . . . . . . 150 c tssop package ja thermal impedance . . . . . . . . . . . . . . . . . . . . 97.9 c/w jc thermal impedance . . . . . . . . . . . . . . . . . . . . . . 14 c/w lead temperature, soldering (10 sec) . . . . . . . . . . . . . 300 c ir reflow, peak temperature . . . . . . . . . . . . . . . . . . . . 220 c notes 1 stresses above those listed under absolute maximum ratings may cause perma- nent damage to the device. this is a stress rating only; functional operation of the device at these or any other conditions above those listed in the operational sections of this specification is not implied. exposure to absolute maximum rating condi- tions for extended periods may affect device reliability. only one absolute maximum rating may be applied at any one time. 2 overvoltages at a, en, s, or d will be clamped by internal diodes. current should be limited to the maximum ratings given. top view (not to scale) 28 27 26 25 24 23 22 21 20 19 18 17 16 15 1 2 3 4 5 6 7 8 9 10 11 12 13 14 ADG706 nc = no connect a3 nc gnd s9 s10 s11 s12 v dd nc nc s16 s13 s14 s15 a2 a1 a0 en s1 s2 s3 d v ss s8 s7 s4 s5 s6 top view (not to scale) 28 27 26 25 24 23 22 21 20 19 18 17 16 15 1 2 3 4 5 6 7 8 9 10 11 12 13 14 adg707 nc = no connect nc nc gnd s1b s2b s3b s4b v dd db nc s8b s5b s6b s7b a2 a1 a0 en s1a s2a s3a da v ss s8a s7a s4a s5a s6a ordering guide model temperature range package description package option ADG706bru e40 c to +85 ct hin shrink small outline package (tssop) ru-28 adg707bru e40 c to +85 ct hin shrink small outline package (tssop) ru-28 caution esd (electrostatic discharge) sensitive device. electrostatic charges as high as 4000 v readily accumulate on the human body and test equipment and can discharge without detection. although the ADG706/adg707 features proprietary esd protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. therefore, proper esd precautions are recommended to avoid performance degradation or loss of functionality. warning! esd sensitive device
?6? rev. a ADG706/adg707 terminology c d (off) off switch drain capacitance. measured with reference to ground. c d , c s ( on) on switch capacitance. measured with reference to ground. c in digital input capacitance t transition delay time measured between the 50% and 90% points of the digital inputs and the switch on condition when switching from one address state to another t on ( en) delay time between the 50% and 90% points of the en digital input and the switch on condition t off ( en) delay time between the 50% and 90% points of the en digital input and the switch off condition t open off time measured between the 80% points of both switches when switching from one address state to another charge measure of the glitch impulse transferred from injection the digital input to the analog output during switching off isolation measure of unwanted signal coupling through an off switch crosstalk measure of unwanted signal that is coupled through from one channel to another as a result of parasitic capacitance bandwidth frequency at which the output is attenuated by 3 db on response frequency response of the on switch insertion loss due to the on resistance of loss the sw itch v dd most positive power supply potential v ss most negative power supply in a dual-supply application. in single-supply applications, this should be tied to ground at the device. i dd positive supply current i ss negative supply current gnd ground (0 v) reference s source terminal. may be an input or output. dd rain terminal. may be an input or output. ax logic control input en active high device enable v d (v s )a nalog voltage on terminals d, s r on ohmic resistance between d and s r on on resistance match between any two channels, i.e., r on max e r on min r flat(on) flatness is defined as the difference between the maximum and minimum value of on resistance as measured over the specified analog signal range. i s ( off ) source leakage current with the switch off i d (off) drain leakage current with the switch off i d , i s ( on) channel leakage current with the switch on v inl maximum input voltage for logic 0 v inh minimum input voltage for logic 1 i inl (i inh ) input current of the digital input c s (off) off switch source capacitance. measured with reference to ground. table i. ADG706 truth table a3 a2 a1 a0 en on switch xxxx0 none 000011 000112 001013 001114 010015 010116 011017 011118 100019 1001110 1010111 1011112 1100113 1101114 1110115 1111116 x = don?t care table ii. adg707 truth table a2 a1 a0 en on switch pair xxx 0 none 000 1 1 001 1 2 010 1 3 011 1 4 100 1 5 101 1 6 110 1 7 111 1 8 x = don?t care
?7? rev. a v d or v s , drain or source voltage e v on resistance e 0 0 15 23 4 1 t a = 25 c v ss = gnd v dd = 2.7v v dd = 3.3v v dd = 4.5v v dd = 5.5v 2 3 4 5 6 7 8 tpc 1. on resistance as a function of v d (v s ) for single supply 0 30 t a = 25 c e2 1123 v dd = +2.5v v ss = e2.5v on resistance e 8 7 6 5 4 1 2 3 v d or v s , drain or source voltage e v tpc 4. on resistance as a function of v d (v s ) for dual supply v d (v d = v dd e v s ) e v current e na 0.3 0.2 e0.2 01 5 234 0.1 0 e0.1 v dd = 3v v ss = 0v t a = 25 c i d , i s (on) i s (off) i d (off) e0.3 tpc 7. leakage currents as a function of v d (v s ) on resistance e 8 7 0 01 5 234 6 5 4 +85 c e40 c v dd = 5v v ss = 0v 1 2 3 +25 c v d or v s , drain or source voltage e v tpc 2. on resistance as a function of v d (v s ) for different temperatures, single supply v d or v s , drain or source voltage e v 0 0.5 7 6 5 4 3 2 1 0 on resistance e 1.0 1.5 2.0 2.5 3.0 8 e40 c +25 c +85 c v dd = 3v v ss = 0v tpc 5. on resistance as a function of v d (v s ) for different temperatures, single supply v dd = +2.5v v ss = e2.5v t a = 25 c v d (v d = v dd e v s ) e v current e na 0.3 0.2 e0.3 0.1 0 e0.2 i d , i s (on) i s (off) i d (off) e0.1 e2.75 0 e2.00 e1.00 1.00 2.00 2.75 tpc 8. leakage currents as a function of v d (v s ) v dd = +2.5v v ss = e2.5v 2.75 0 2.00 1.00 1.00 2.00 2.75 +85 c +25 c e40 c on resistance e 5 4 0 3 2 1 6 7 8 v d or v s , drain or source voltage e v tpc 3. on resistance as a function of v d (v s ) for different temperatures, dual supply v d (v d = v dd e v s ) e v current e na 0.3 0.2 0.2 01 5 234 0.1 0 0.1 v dd = 5v v ss = 0v t a = 25 c i d , i s (on) i s (off) i d (off) tpc 6. leakage currents as a function of v d (v s ) s1 v s v dd gnd d v dd v ss en ** a0 a1 a2 a3 v out r l 50 ADG706 * s16 * similar connection for adg707 ** connect to 2.4v for bandwidth measurements off isolation = 20log 10 (v out /v s ) insertion loss = 20log 10 v out with switch v out without switch ) ( v ss 50 tpc 9. leakage currents as a function of temperature ADG706/adg707 t ypical performance characteristicse
?8? rev. a ADG706/adg707 temperature e c current e na 0.3 0.2 e0.1 5 0 i d , i s (on) i s (off) i d (off) 0.1 15 25 35 45 55 65 75 85 0.4 0.5 0.6 0.7 0.8 v dd = 3v v ss = gnd v d = 3v/1v v s = 1v/3v tpc 10. leakage currents as a function of temperature frequency hz 100k 1m 10m 100m 0 30k attenuation e db 20 40 60 80 100 120 v dd = 5v t a = 25 c tpc 13. off isolation vs. frequency frequency e hz attenuation e db 0 e10 10k ADG706 adg707 100k 1m 10m 100m e8 e6 e4 e2 tpc 11. on response vs. frequency voltage e v q inj e pc e40 e30 e20 e10 0 10 20 v dd = 5v v ss = gnd v dd = 3v v ss = gnd v dd = +2.5v v ss = e2.5v e3 e2 e1 012345 tpc 14. charge injection vs. source voltage frequency e hz 10k 100k 1m 10m 10m 10 current e a 1m 100 10 1 100n 10n 1n 100 1k t a = 25 c v dd = +2.5v v ss = e2.5v v dd = +3v v dd = +5v tpc 12. supply currents vs. input switching frequency frequency hz 1m 10m 100m 0 attenuation db 20 40 60 80 100 120 v dd = 5v t a = 25 c 100k 30k tpc 15. crosstalk vs. frequency
?9? rev. a ADG706/adg707 s d v1 v s i ds r on = v 1 /v ds test circuit 1. on resistance s1 d v s v dd v ss v d s2 s16 gnd 0.8v en v dd v ss a i s off test circuit 2. i s (off) test circuits s1 d v dd v ss v s s2 s16 gnd 0.8v en v dd v ss a i d off v d test circuit 3. i d (off) d v dd v ss v s s1 s16 gnd 2.4v en v dd v ss a i d on v d test circuit 4. i d (on) s1 d v in v dd v ss gnd d v dd v ss en a0 a1 a2 a3 50 v s1 s16 v s16 v out r l 300 c l 35pf ADG706 * s1 thru s15 * similar connection for adg707 2.4v v s1 v s16 0v 3v v out address drive (v in ) t transition t transition 50% 50% 90% 90% test circuit 5. switching time of multiplexer, t transition s1 d v in v dd v ss gnd d v dd v ss en a0 a1 a2 a3 50 v s s16 v out r l 300 c l 35pf ADG706 * s1 thru s15 * similar connection for adg707 2.4v address drive (v in ) v out 3v 0v v s 80% 80% t open test circuit 6. break-before-make delay, t open
?10? rev. a ADG706/adg707 s1 v in v dd v ss gnd d v dd v ss en a0 a1 a2 a3 50 v s v out r l 300 c l 35pf ADG706 * s2 thru s16 * similar connection for adg707 50% 50% t off (en) 0.9v o v o 0v 3v output enable drive (v in ) 0v 0.9v o t on (en) test circuit 7. enable delay, t on (en), t off (en) v in v dd v ss gnd d v dd v ss en a0 a1 a2 a3 v out c l 1nf ADG706 * * similar connection for adg707 v s r s s 0v 3v v out q inj = c l v out v out logic input (v in ) test circuit 8. charge injection s1 v s v dd gnd d v dd v ss en ** a0 a1 a2 a3 v out r l 50 ADG706 * s16 * similar connection for adg707 ** connect to 2.4v for bandwidth measurements off isolation = 20log 10 (v out /v s ) insertion loss = 20log 10 v out with switch v out without switch ) ( v ss 50 test circuit 9. off isolation and bandwidth s2 v s v dd gnd d v dd v ss a0 a1 a2 a3 v out r l 50 ADG706 * s16 * similar connection for adg707 channel-to-channel crosstalk = 20log 10 (v out /v s ) v ss en s1 2.4v 50 50 test circuit 10. channel-to-channel crosstalk
?11? rev. a ADG706/adg707 28-lead tssop (ru-28) 0.177 (4.50) 0.169 (4.30) 28 15 14 1 0.386 (9.80) 0.378 (9.60) 0.256 (6.50) 0.246 (6.25) pin 1 seating plane 0.006 (0.15) 0.002 (0.05) 0.0118 (0.30) 0.0075 (0.19) 0.0256 (0.65) bsc 0.0433 (1.10) max 0.0079 (0.20) 0.0035 (0.090) 0.028 (0.70) 0.020 (0.50) 8 0 outline dimensions dimensions shown in inches and (mm).
?12? printed in u.s.a. c01001?0?5/02(a) ADG706/adg707 rev. a revision history location page 5/02?data sheet changed from rev. 0 to rev. a. edits to features and product highlights . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 changes to specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 edits to absolute maximum ratings notes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 edits to tpcs 2, 3, 4, 6e9, 12, 14 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7e8 edits to test circuits 9 and 10 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10

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